The Optical Metrology conference organized by SPIE Europe focuses on the latest research addressing optical metrology methods and their application for solving measurement problems in industrial design and production engineering as well as dealing with modeling aspects in Optical Metrology in a separate section. In a further sub-conference, participants will learn about recent advances in the use of optical technologies to preserve our shared cultural heritage. Optical Metrology addresses attendees like engineers, scientists, researchers, and managers.

Topics: Metrology in Industrial Design and Engineering, Modelling Aspects of Metrology, Metrology Instruments and Systems, Novel Technologies for documentation, study and preservation of works of art, archaeological sites, historical builidings and other artefacts

Gerneral:
Organized by SPIE Europe
Sponsored by SPIE Europe and SPIE
In cooperation with EOS, WLT

Symposium Chairs: Osten (D), Kujawinska (PL), Tatam (UK)

Subconferences:
Optical Measurement Systems for Industrial Inspection Chair: Osten Lehmann (D)
Modeling Aspects in Optical Metrology Chair: Bosse (D)
Optics for Arts, Architecture, and Archaeology Chairs: Fotakis (GR), Pezzati (I), Salimbeni (I)

Organized by:

Optical Metrology
SPIE Europe
2 Alexandra Gate, Ffordd Pengam, CF24 2SA, Cardiff, UK
Tel. +44 (0) 29 20 89 47 47
spieeurope_info@spieeurope.org
http://spie.org/events/eom
http://spie.org/optical-metrology.xml