The Optical Metrology conference organized by SPIE Europe focuses on the latest research in optical metrology, videometrics and machine vision with applications for solving measurement and inspection problems in industrial design and production engineering, vehicle navigation, multimedia technology, architecture, archaeology and arts.

Special emphasis is directed to model based, remote and active approaches, sensor fusion, robot guidance, image sequence processing and scene modeling, as well as to the preservation of our shared cultural heritage.

Optical Metrology addresses attendees like engineers, scientists, researchers, trustees and managers.

Topics:

• Optical Metrology in Industrial Design and Production Engineering
• Modelling Aspects in Optical Metrology
• Metrology Instruments and Systems
• 3D Sensing and Visualization
• Imaging and Image Procession
• Autonomic Navigation
• Documentation, Preservation and Restoration of Art Work, Archaeological sites and Historical Buildings
  

General:

• Organized by SPIE Europe
• Sponsored by SPIE
• In cooperation with EOS and WLT

General Chairs: Osten (DE), Buse (DE), Moore (GB)

Subconferences:

• Optical Measurement Systems for Industrial Inspection
  Chairs: Lehmann (DE)
• Modeling Aspects in Optical Metrology
  Chairs: Bodermann (DE)
• Optics for Arts, Architecture, and Archaeology
  Chairs: Pezzati (IT), Targowski (Pl) 
• Videometrics, Range Imaging and Applications
  Chairs: Remondino (IT) and Shortis (AU)
• Optical Methods for Inspection, Characterization and Imaging of Biomaterials
  Chairs: Ferraro (IT), Ritsch-Marte (AT)
• Automated Visual Inspection
  Chairs: Beyerer (DE), Puente León (DE), Berthold (DE), Co-Chair: Harding (US)
• Industry meets Academia
  Chairs: Reingand (US), Osten (DE), Ostendorf (DE)

Organized by:
Optical Metrology
SPIE Europe Ltd
2 Alexandra Gate, 
Ffordd Pengam, 
CF24 2SA, Cardiff, UK 
Phone: +44 292 089-4747 
E-mail: info@spieeurope.org
http://spie.org/x6506.xml